直线式压电垂直驱动振动给料机设计

Design of Linear Piezoelectric Vertical-driving Vibratory Feeder

中文关键词: 压电  垂直驱动  振动给料机  环形压电双晶片  振动模态  输出力  实验测试

英文关键词: piezoelectric  vertical-driving  vibratory feeder  ring piezoelectric bimorphs  vibration mode  output force  experimental test

中文摘要:

      目的 为了满足现代电子工业领域中对微小电子元器件高速送料的需要，采用环形压电双晶片，设计一种直线式压电垂直驱动振动给料机。方法 首先对给料机结构进行设计，阐述其工作原理，通过对环形压电双晶片进行模态分析，确定双晶片工作振型。然后利用小挠度的弹性薄板理论，推导压电双晶片输出力的表达式，利用Matlab软件，探究压电陶瓷和基板的厚度与出力系数的关系，以及压电陶瓷和基板的弹性模量与出力系数的关系。最后制作振动给料机样机，并对其进行实验测试。结果 测试结果表明，系统有效工作频率为184～190 Hz，当驱动电源电压为220 V，频率186.8 Hz时，对3.2 mm×2.8 mm的发光二极管(LED)给料速度可达到22.6个/s，比市场上同型号的矩形压电双晶片驱动给料机速度提升了14.7%。结论 在精密电子元件高速输送的自动化包装或自动化检测线上具有良好的应用前景。

英文摘要:

      The work aims to design a linear piezoelectric vertical-driving vibratory feeder by ring piezoelectric bimorphs, so as to meet the needs of high-speed feeding of micro electronic components in the field of modern electronic industry. Firstly, the structure of the feeder was designed, and the working principle of the feeder was described. Through the modal analysis of the ring piezoelectric bimorphs, the working vibration mode of the bimorphs was determined. Then, the output force expression of piezoelectric bimorphs was derived by the elastic thin plate theory with small deflection. MATLAB software was applied to investigate the relationship between the thickness of piezoelectric ceramics and substrate and the output coefficient, and the relationship between the elastic modulus of piezoelectric ceramics and substrate and the output coefficient. Finally, a prototype of the vibratory feeder was made and tested. The test results showed that the effective working frequency of the system was between 184-190 Hz. When the driving power supply voltage was 220 V and the frequency was 186.8 Hz, the feeding speed of 3.2 mm×2.8 mm LED reached 22.6 pcs/s, which was 14.7% higher than that of the rectangular piezoelectric bimorphs-driven feeder of the same model in the market. The proposed feeder has a good application prospect in the automatic packaging or automatic testing line for the high transportation of precision electronic components.